High-Voltage Switching Device Testing using the AARTS HV System
The advanced development of new technologies, such as SiC and GaN, have created the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch.
Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
Accel-RF Instruments (ARF) has developed a test system capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at a up to 1-MHz switching frequency (depending on high voltage level). By leveraging the existing RF burn-in tray platform, support for testing of multiple devices under elevated temperature stimulus in a small physical area is efficiently facilitated.
STAr Launches Next Generation All-in-One Per-Pin SMU Rel. Test System
The next generation Pluto series all-in-one reliability test system delivers two long awaiting fundamental capabilities to the world. First is the per-pin SMU with measurement speed down to one microsecond, and second is its complete HCI, GOI and EM all-in-one reliability test qualification capabilities. With a maximum of 960 per-pin SMUs supporting reliability tests for HCI/BTI with up 480 transistors, GOI with up to 960 gate oxides and EM with up to 480 interconnects in parallel. This new one-of-a-kind reliability test system surpasses all competing reliability systems in the market and achieves highest test performance and throughput at lowest cost-of-tests.
STAr Technologies provides intellectual property, software, hardware, consumables, service and expertise to meet the requirements and challenges within the semiconductor industries. STAr expertise extents across parametric electrical tests (E-test), wafer-level and package-level reliability (WLR & PLR), mixed signal tests, assembly and packaging services, probe cards, load boards, test interfaces and sockets. STAr’s major customers include top tier players in the semiconductor industries such as tsmc, UMC, Global Foundries, SMIC, KYEC, ASE, Samsung, Hynix, Toshiba, Renesas, Maxim, OmniVision, etc.
STAr – Standing the Test of Time
“We have listened to users who long wanted per-pin SMU reliability test system, STAr has pioneered the next generation Pluto per-pin SMU reliability test system to meet this need. Pluto supports complete range of nanometer node process and device reliability qualification and with full-flexibility for user to develop customized test programs and qualification methodologies for their own needs. This all-in-one reliability open platform test system will revolutionize the reliability test industry with highest throughput and test capabilities enabling users to mix-and-match different reliability tests in one system. STAr’s Pluto reliability test system will significantly lower overall investments with increasing flexible capacity planning for all semiconductor wafer fabs,” said Dr. Choon-Leong Lou, CEO of STAr Technologies.
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