Tough Testing Challenge: JFET Gate Current Measurements – AN 111
A customer with a picoammeter matrix (PAM) card and a low leakage probe card, both from Reedholm, had a new requirement to measure gate current of junction field effect transistors (JFET’s), but was unsure that it could be done rapidly enough for in-line testing. The evaluation performed by Reedholm showed that sub-pA gate leakage testing could be done in <1 second per die, and faster if there was no leakage introduced by device packaging or the probe card. At 200msec test times, uncertainties could be <±100fA. These conclusions were based on gate leakage current measurements of four JFET’s bonded in TO-5 type cans. They were tested at Reedholm on a PAM-12 based RI-40 with a PCIA interface and a low leakage DUT card. The quality of the test fixturing was more than adequate for measuring the true current leakage of the JFET’s. Data was also generated for an open socket condition and for a Motorola 2N5486 JFET. Click here for the full applications note 100kHz Reedholm Capacitance Meter On SaleThrough the end of the year, the Reedholm 100kHz capacitance meter is available at a 25% discount. Consider taking this opportunity to either add this capability to your parametric test system, retire your unsupported third party HP/Agilent or Boonton capacitance meters, or as a spare to help ensure tester up-time.
A major performance advantage is the virtual elimination of inductance effects due to signal path lengths. Self-inductance requires up to 10% adjustments for apparent capacitance errors at 1MHz are reduced by 100:1 at 100kHz. Another advantage is that there is very little ac noise near the 100kHz frequency compared to 1MHz. Click here to go to the web site for more details.
BCD HQ in Shanghai
Client Profile: BCD/Diodes Inc
Asia is the largest market for semiconductor consumption. There are very few analog providers and even fewer power management IC vendors in the region. OEM’s and ODM’s frequently look to BCD to provide system-level insight as well as design and technical support to reduce time-to-market. Click here for Profile
The sun never sets on Reedholm Systems. That’s because Reedholm products are found worldwide in large and small semiconductor companies, handling everything from routine process control to production die sort, to a variety of wafer and packaged level test requirements.
We have a rich 30+ library of IP to draw from and a new management team. Simply put, we want to make it possible for customers to have test system that work the way they need them to. We have a host of projects under consideration, ranging from SW extensions to HW improvements designed to modernize and continuously improve our systems.
Whether this is your first time hearing of us, or you are an established customer, we hope you find out newsletter to be technically informative. We welcome the chance to serve you and help address your test requirements.
We look forward to hearing from you.
Jim Reedholm Upcoming Events:
WiPDA – Albuquerque New Mexico, USA – October 31 – Nov 1, 2017 : Wide Band Gap Semiconductor Workshop