Tough Testing Challenge: BVCEO Breakdown Measurements – AN-124 Measuring BVCEO is tricky at any voltage and is a slow test at low IC because any charge injected into the base when biasing the transistor has to fully recombine before an accureate measurement can be made. Several Reedholm routines used to directly find BVCEO are characterized in terms of speed and resolution, illustrating the speed issue. In addition, a couple of methods are described that produce results much faster than the direct method of measuring BVCEO at a specific IC. Click here for the full applications note WBG Reliability Test: HTRB, HTGB, HTOL
To address the need for statistically significant sample sizes for reliability testing, the WBG systems offer 30 DUT per experiment stress condition and up to 3 simultaneous experiments for a total of up to 90 DUT under stress. Each experiment operates independently of the others and switch in the parametric measurement instrumentation for periodic measurement cycles. Click here for further details
Our focus at Reedholm is on the accurate and fast measurement of test structures, both at the wafer and packaged levels. This focus also makes our systems suitable for final DC test of funtionality for some products.
We concentrate on applications, not the sale of products. We want to ensure the integrated system can be used on the day of installation. This approach can take more time and effort but it is worth it.
We provide data-driven test environments that are easy to use and which eliminate the need to program, making the difficult tasks of interpreting and resolving cryptic run-time and compiler error messages a thing of the past.
Reliability and Durability are designed into each of our systems. Working lives of decades are realistic. State of the art performance is maintained with periodic system upgrades that provide new life at a fraction of the price of a new system.
Please let us know if you would like more information. We welcome the chance to serve you and help address your test requirements.
Jim Reedholm – CEO Upcoming Events:
CS Mantech – Booth 713
208 Barton Springs Road, Austin, TX USA
May 7-10, 2018