Tough Testing Challenge: Fast Low Current Measurements of Photo Diode Arrays GaAs fabs produce photodiode array optical device wafers with, sometimes, hundreds of thousands of diodes resulting in lots of pixels which have to be electronically tested, typically in the pA range causing a production and engineering challenge.Rack and Stack systems used for testing often prove to be a production bottleneck. Significant faster and higher throughputs are possible with standard Reedholm Test Systems, for example a 4x speed gain was achieved using Reedholm Low Current Measurements with the PAM-16>1pA resulting in a 1.8 hour test cycle for 100,000 pixels improving from 12 hours. Click here for further details
WBG Collaboration with Texas State University & Piner Research Group
July 17, 2018 Georgetown, TX – Reedholm Systems announces, effective immediately, that the Company has formally engaged with The Piner Research Group (located on the Texas State University Campus) to develop reliability methods and standards for production test of WBG devices (wide band gap) as well as to provide technical consulting services to Reedholm Systems.
Both parties recognize the unique needs and challenges faced by WBG device manufacturers and Reedholm Systems’ need to refine its measurement instrumentation and long-term reliability stress capabilities specifically for the GaN, SiC, GaN on Si, and other WBG devices and materials. Click here for further details
Thanks to all of those that came to see us at CS Mantech in Austin, TX. As always, the organizers at CS Mantech know how to throw a party, with no shortage of food, drinks and snacks throughout the event! Well done!
From discussions about fast production test systems, to ways of dealing with oscillations with high speed devices to novel WBG reliability stress test systems – we were busy throughout the event.
Joining us in our booth at CS Mantech was Dieter Ratheir of DR YIELD. As many of you saw, DR YIELD creates software based yield solutions for the integration and visualization of data and helps you make sense of it. This allows smarter and faster decisions, ultimately resulting in significant cost savings. Once installed, it will quietly sit back and look for anomalies in the data that don’t trigger existing rules and automatically alert your engineers. Let us know if you would like more information.
We will be traveling throughout the Pacific Rim in September. We look forward to face to face meetings with both existing and future customers. If you would like to meet then, please drop us a line.
Jim Reedholm – CEO
The 6th Annual IEEE Workshop on Wide Bandgap Power Devices & Applications
Georgia Tech Hotel and Conference Center
Atlanta, Georgia | www.wipda.org
Oct 31 – Nov 2, 2018