For Immediate Release Reedholm Systems: RS-100 WBG HTOL-HTRB Reliability Test System December … Read More»
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In conjunction with Reedholm Systems, technical support augmenting what is available from principals for many of the products noted below.
YieldWatchDog is a high performance yield management software solution that enables 24/7 storage, analysis as well as tracking of any anomalies arising during the chip manufacturing process. YieldWatchDog is able to recognize patterns and automatically inform you as soon as any irregularities occur. The intuitive and responsive user interface accelerates the understanding and resolving of problems. This means that your material waste will be reduced, quality issues and customer returns prevented, and engineering resources used far more efficiently. On top of this … your yield will increase too.
Probe System for Life (PS4L)
The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
PS4L systems are available to handle products from 50 mm to 300 mm, and are available in manual, semiautomatic, and fully automatic configurations. A unique advantage of the PS4L system is its ability to be upgraded at any point in its life cycle as your product needs or volume requirements change. As the customer’s business environment or test conditions change, the PS4L can be rapidly reconfigured to meet these new requirements. Changes to wafer size, automation level, or test procedure do not translate into a need for new capital equipment. This substantially reduces the cost of new product development and the time to procure the appropriate test equipment. Reconfigurations are typically performed in the field, at the customer site.
|Reliability Test An excellent semiconductor reliability engineering system comprises of design for reliability, wafer-level and package-level reliability, device/process qualification and continuous reliability monitoring. STAr uses its extensive industry expertise to design, build, test and support reliability systems for semiconductor devices and interconnects reliability life test, IC product burn-in, environmental test, product screening, PCB reliability test, etc. to fulfill all the needs to build a solid reliability engineering system.|
|All-in-one Reliability Tester STAr Gemini is an all-in-one reliability tester for hot-carrier injection (HCI), biased temperature instability (BTI), time-dependent dielectric breakdown (TDDB), stress induced leakage current (SILC), electromigration and stress migration. STAr Gemini can be configured with up to 960 four-quadrant VI per pin stress-measurement units with leakage current down to 1.0 pA.|
Advanced Device Reliability STAr Scorpio ART provides the series of reliability testers to support massively parallel advanced semiconductor reliability analysis. All systems are designed to fulfill JEDEC requirements to support advance and accurate MOSFET HCI/BTI, GOI/TDDB and OTF qualifications for nanotechnology devices. Systems for both PLR and WLR applications are available.
|Advanced Interconnect Reliability STAr Scorpio AIR is the series of reliability testers to support back-end-of-line electromigration analysis. Scorpio AIR enables electromigration and inter-metal dielectric TDDB for advanced interconnects reliability qualification. Scorpio AIR supports JEDEC complaint methodologies including TCR, Constant I, Isothermal, SWEAT and BEM for both package and wafer level tests.|
|Power Device Reliability STAr Scorpio hiVIP series covers the reliability requirements for high power devices with voltage requirements up to ±200V. Systems are designed to support both precise lo- and hi- voltage stress bias at board level to fulfill the tests requirements on both DMOS and power MOSFETs. Power devices reliability applications including HCE/HTRB/HTGB, GOI/TDDB and Vt Stability are available. |