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E Test Reps January 2023 Newsletter Issue 28 (DR YIELD)
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Christmas and New Year’s Hours
Reedholm Systems will be closed December 23 – January 2, 2023. We hope everyone has a wonderful and safe holiday season!
Fall 2022 Reedholm Systems Newsletter
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E Test Reps October 2022 Newsletter Issue 27 (SURAGUS)
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E Test Reps August 2022 Newsletter Issue 26 (SemiProbe)
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Multi-Purpose Vacuum Probing – up to 300mm wafers in open air
Sometimes customers like the ability to use the vacuum chamber as a multi-purpose probing solution for a variety of applications – open air and under vacuum. Basic I-V, C-V and HF measurements using coaxial, triaxial, kelvin and HF probe arms, cables and connectors are used for open air and low voltage applications. When vacuum is required, the chamber is cleaned and sealed and operated to vacuum levels as low as 10-6 torr. Similar basic measurements under vacuum can be made as well as high voltage up to 10 KV.

Semiprobe’s Advanced Vacuum Probing Applications
The SemiProbe family of vacuum probing systems have expanded due to new application requirements – high volume MEMS testing, High Voltage testing and 300 mm. SemiProbe has a family of manual, semiautomatic and fully automatic vacuum probing systems primarily to test MEMS and High Voltage Devices. MEMS Production Testing under Vacuum
Historical MEMS probing solutions involved manual and semiautomatic systems that were primarily used for research, device characterization and limited production. In the past two years systems were developed for production (24/7) applications that include material handling, pre-aligners, end-effectors, multiple black bodies, thermal (-60 C to 300 C), test equipment, customized graphical user interfaces (GUI) and vacuum levels to 10-6 torr. Most vacuum testing occurs between 10-3 torr and 10-6 torr. Individual manipulators (programmable) or a probe card are used to contact the device under test (DUT). Wafers tested range from 150 mm to 300 mm in size. Automated handling of the wafers is performed using a few methods – cassettes with wafers or cassettes with a carrier plates with wafers.

Click here for additional information on SemiProbe’s Vacuum Probing
E Test Reps July 2022 Newsletter Issue 25 (DR YIELD)
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Spring 2022 Newsletter – Issue 12
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