As high-power semiconductor demand increases, our wide band gap production systems provide fast, affordable, automated wafer testing in an easy-to-use, compact package. They can handle up to 10kV/50A power and are designed with production operators and product quality in mind.
Data driven software makes this system simple to optimize and use without the need for programing, quick and easy to bring into service, and offers near endless test plans, all while maintaining test speeds faster than IEEE-488 Controlled systems.
For new SiC and GaN fabs, these integrated test systems are a great solution because they save time and materials in production, while costing less at the outset.
If you need 10kV,50A test capacity in a reliable, ready-to-use system, with a small footprint and no programming required, get in touch. Let us help you get your high-power fab set up right.
Since 1983, our dc test systems have helped semiconductor and electronics manufacturers assure quality and reliability in process development, wafer acceptance testing, and reliability evaluations.
We don’t just offer test systems, we offer complete solutions: proprietary memory-mapped instruments and switching matrix modules that span from microvolts to 10kv and femtoamps to 50A together with our proprietary, data-driven software.
With our wide range and data-driven software we can provide systems for the latest digital technologies as well as high-power analog circuits and transistors. And with our test solutions you’ll eliminate latency delays and test uncertainties without the need to turn device engineers into programmers.
It’s interesting how innovation stirs up nostalgia. When change grips us, it changes how we think and act and buy in the blink of an eye.
In just one decade, Americans transitioned from horse and buggy to automobiles, the entire horse and buggy industry was set aside for Ford’s model T as a nation began to buy differently. When the first McDonald’s opened in the 1940’s, we didn’t even know we wanted fast food restaurants and drive-through service. And few of us imagined how we’d embrace Amazon delivery; now we buy everything differently.
One of the most iconic symbols of technological advancement: the NASA computers from the 1960’s, filling an entire room… and now that same computer fits in our pockets.
Back in the 1980s we introduced a test system that filled just the right gap, enabling wafer level reliability testing and inspiring semiconductor fabs to buy differently. We’re still using those test systems today, and in contrast to the new technology we’re set to introduce, they remind us of this NASA computer system vs. the cell phone in your pocket.
SmartProbe®, the modern production parametric test system, is a giant leap forward, bringing modern wafer production into the 21st century. Our new tester is more powerful, less expensive, and fits in your pocket – and we can’t wait to show it to you!