SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
All WIS systems are designed based on SemiProbe’s patented adaptive architecture. Unlike traditional inspection systems, all foundation modules – bases, stages, chucks, microscope mounts, microscope movements, optics, manipulators and more – are interchangeable, which makes the WIS the consummate solution for many different applications and budgets. This unique modular design enables customers to acquire inspection capabilities that precisely match their requirements.
The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
PS4L systems are available to handle products from 50 mm to 300 mm, and are available in manual, semiautomatic, and fully automatic configurations. A unique advantage of the PS4L system is its ability to be upgraded at any point in its life cycle as your product needs or volume requirements change. As the customer’s business environment or test conditions change, the PS4L can be rapidly reconfigured to meet these new requirements. Changes to wafer size, automation level, or test procedure do not translate into a need for new capital equipment. This substantially reduces the cost of new product development and the time to procure the appropriate test equipment. Reconfigurations are typically performed in the field, at the customer site.
SemiProbe is a worldwide leader in the design and production of probing and inspection systems to the semiconductor industry. We provide the most modular and flexible probing and inspection platforms available today.
Who Is Semiprobe?
Denis Place, Mostafa Daoudi & Don Feuerstein founded SemiProbe in 2006 to address market voids in the analytical probing market. Collectively, before founding SemiProbe, they worked as managers at SUSS MicroTec North American Probing Division in Waterbury Center, VT for 35 years. They founded SemiProbe with several objectives in mind:
Capital equipment is expensive – Get more for your money! SemiProbe platforms reduce lifetime costs for our customers. Our systems evolve with our customers needs, dramatically extending their useful lifespan.
Provide the most modular and flexible probing platform – We give our customers the capability to adapt, customize and upgrade systems to their specific needs.
Perpetual field upgrade path – SemiProbe’s systems and patented technology gives customers the ability to upgrade their existing system with new modules and accessories. All key building blocks of the PS4L are interchangeable and upgradeable.
Manual Systems can be upgraded to larger Manual or Semiautomatic Systems
Semiautomatic Systems can be upgraded to larger Semiautomatic Systems or Fully Automatic Systems
Upgrades are performed at the customer’s site and all upgrades are completed in 1 or 2 days
We look forward to hearing from you to discuss your testing requirements.
About E Test Reps:
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