Pluto – An Advanced All in One Reliability Test System for 2020 and Beyond
Pluto is an “All-in-One” Reliability System covering AC/DC reliability test such as ultra-fast BTI, HCI/HCE, GOI/TDD and DC or AC electromigration. Flexible software makes it possible to edit, change, or add algorithms or test flows as required. And it is designed with capacity in mind for qualification and monitoring, with up to 480 four terminal devices under test with a for oven configuration. Wafer level reliability configurations are also available.
The modular configuration makes it possible to operate with a mix/match of low and high voltage modules within the same systems. Some of the key capabilities of the EM system are:
Highly parallel stress-measurements, where all DUT’s are tested concurrently, and all boards/modules are run in parallel.
Independent SMU for each terminal, with a dedicated per channel kelvin source and measurement unit, delivering precision resistance measurements (<0.3%) for advanced technologies.
The per pin SMU makes low nA current level stressing possible and the parallel measurements gives highly accurate timing for EM stress.
Come See STAr:
STAr is again exhibiting at IRPS. For going on six decades, IRPS is the place to present and discuss new and original work in the area of microelectronics reliability, and draws participants from all over the world. This years conference is in Dallas, TX from March 29 – April 2 at the Hilton DFW Lakes Executive Conference Center in Grapevine, TX.
STAr – Standing the Test of Time
Whether you perform your intrinsic reliability measurements at wafer or packaged level, STAr Technologies has cost effective, technically sound solutions that stand the test of time:
In-depth knowledge from working directly with the world’s leading semiconductor manufacturers over the last 20 years has resulted in an array of offerings – from general purpose all in one reliability systems to failure mechanism specific offerings (metallization, oxides, transistors).
This top to bottom focus as a comprehensive provider means all of the key elements – instrumentation, probe station, probe or DUT card, and software are fully integrated and turn-key.
More than 12 years of experience have shown that the boards and cards simply do not wear out – only the connectors have to be replaced if/when damaged. Compares to alternate solutions that can require $100k replacements EVERY 12 to 24 months, using STAr results in bottom line savings, year after year.
Whether you have new requirements that require new capabilities, or are looking to replace existing systems that are getting long in the tooth and expensive to maintain, STAr offers an array of cost effective solutions.
If such savings are of interest, let us know and we will schedule a call or online meeting to discuss your requirements.
About E Test Reps:
ETR is a sales representative and marketing firm based in Austin, TX serving a worldwide customer base. We seek out principals that avoid surprises while delivering on time solutions that give customers more than they expect.