DR YIELD launches their latest product YieldWatchDogXI
DR YIELD’s vision of shaping the future of semiconductor yield software develops even further with an additional artificial intelligence layer in 2020.
Ever since the company has been founded, DR YIELD has been continuously working on enhancing their smart solution – YieldWatchDog in order to provide the best software possible for all semiconductor companies around the globe. As a result, at this year’s SEMICON West 2020, DR YIELD launched a new remarkable product – YieldWatchDogXI.
YieldWatchDogXI stands for eXpanded Intelligence and it provides features which create knowledge out of data, thereby giving new and valuable insights usually unobtainable through a classic yield software.
YieldWatchDogXI features intelligent algorithms like intelligent tool analytics, smart pattern recognition and multivariate monitoring.
Intelligent Tool Analytics: Optimize your equipment uptime and prevent failures
YWDXI allows you to analyze tool interactions with maximum efficiency. In order to detect tools that in combination contribute to yield loss, YWDXI detects problematic tool combinations and pinpoints process improvement possibilities. Additionally, it allows you to identify “golden tool combinations” for routing of important lots.
Smart Pattern Recognition: Optimize your semiconductor manufacturing process
YWDXI automatically detects and classifies wafers with conspicuous patterns – this enables rapid material review and wafer disposition.
Deep Root-Cause Analysis: Multivariate Monitoring for full process visibility
The multivariate monitoring feature of YWDXI allows you to review individual parameters and detect hidden correlations that would otherwise not be visible. Fast processing and calculation times are ensured by deploying mechanisms such as dimension reduction. Built-in Principal Component Analysis enables you to break down the multivariate statistics into its components.
About DR YIELD:
DR YIELD software & solutions is a leading provider of yield management software in the silicon and compound semiconductor industry. With the smart solution YieldWatchDog and the latest addition YieldWatchDogXI DR YIELD offers a fast, flexible and innovative analytics software that can be perfectly integrated within the company’s manufacturing structures.
DR YIELD has a solution to the historic problem of siloed semiconductor data. An ongoing challenge is that fab data is often kept separate from the volumes of engineering and test data collected and stored in separate silos. This means issues identified in one area often remain unconnected or unknown to engineers working with different database.
By utilizing DR Yield as the database that sits on top of all other databases:
It can connect all of that siloed data into one common database, enabling product engineers to quickly connect the dots between problems identified at various stages of the data collection and manufacturing processes.
It will also sit back and be on the lookout 24/7 for anomalies in the data and automatically alert your engineers.
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