Q-Star Test Instruments – Production Test Quality Improvement and Cost Reduction
Q-Star Test ISSx/IDDx instruments are small, high performing, intelligent, add-on plug-and-play measurement instruments providing high-speed high-quality (accuracy and high measurement repeatability) current measurements with zero voltage droop. They are compatible with almost any automated test system (ATE) and with their vector-based control integrate seamlessly in any test program. Their small form factor enables worriless probe card, DUT-board or interface board application in a production test environment.
The Q-Star Test add-on solutions have demonstrated measurements 100 to 1000 times faster than embedded ATE solutions; are able to drive high capacitive loads; and outperform measurement resolution / repeatability of embedded ATE measurement solutions by at least one order of magnitude.
Combine Q-Star Test hardware with your interface board design and our implementation support into your production test flow and see what you have been missing.
ProChek Plus – A Q-Star Test Platform for Device Characterization and Qualification
The ProChek Plus system is a Q-Star Test measurement platform combining up to 48 independently programmable but very tightly synchronized Source Measurement Units (SMUs).
Designed to deliver the essential process-level characterization data to the fabless IC vendor and the foundry, ProChek Plus utilizes high-speed high-quality (accuracy and high measurement repeatability) Q-Star Test instrumentation, portable hardware, and offers a flexible interface that is easy-to-use.
The ProChek Plus system key benefits:
Up to 48 independently programmable Source Measurement Units (SMUs).
Easy and quick development of dedicated, customer specific protocols for NBTI, PBTI, TDDB, HC, EM, and SM device characterizations and in combination with radiation sources also supports TID characterizations
Independent verification of foundry Process Design Kit (PDK) parameters as well as device model development for a wide range of technologies including both new and qualified CMOS, SiGe, and SOI process nodes.
Parallel/concurrent testing of different devices with different test conditions with a up to 50x throughput increase than large rackmount test systems.
About Ridgetop Group:
Founded in 2000 Ridgetop has built an impressive list of customers in North America, Europe, and Asia. Ridgetop has established a stellar reputation serving its government and commercial customers with “best of class” solutions. Our technical staff members have impressive credentials and experience from leading firms such as IBM, Bell Labs, Honeywell, and Burr-Brown (now Texas Instruments). Ridgetop also maintains strong links with leading universities that add depth and leverage to our internal research capabilities. This relationship provides a true “win-win” situation for developing new and advanced techniques for dealing with difficult electronic problems.
The 2019 IDDx Survey Seeks Your Input.
The objectives of the 2019 IDDx Survey are to get an updated view on the use and application of Current based test (as opposed to voltage/logic based test).
ETR is a sales representative and marketing firm based in Austin, TX serving a world wide customer base. We seek out principals that avoid surprises while delivering ontime solutions that give customers more than they expect.